Time Resolved Diffraction Measurements with an Imaging Plate at High Pressure and Temperature.
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- Chen J.
- Center for High Pressure Research and Department of Geosciences, State University of New York at Stony Brook
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- Weidner D. J.
- Center for High Pressure Research and Department of Geosciences, State University of New York at Stony Brook
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- Vaughan M. T.
- Center for High Pressure Research and Department of Geosciences, State University of New York at Stony Brook
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- Li R.
- Center for High Pressure Research and Department of Geosciences, State University of New York at Stony Brook
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- Parise J. B.
- Center for High Pressure Research and Department of Geosciences, State University of New York at Stony Brook
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- Koleda C. C.
- Center for High Pressure Research and Department of Geosciences, State University of New York at Stony Brook
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- Baldwin K. J.
- Center for High Pressure Research and Department of Geosciences, State University of New York at Stony Brook
Bibliographic Information
- Other Title
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- Time Resolved Diffraction Measurement with an Imaging Plate at High Pressure and Temperature
- Time Resolved Diffraction Measurement w
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Abstract
New developments of the imaging plate diffraction system at beamline X17B1 of the NSLS at Brookhaven National Laboratory for high pressure studies are reported here. Time resolved diffraction patterns can be recorded on an imaging plate by translating the plate in this system. This system was used to observe the olivine-spinel phase transformation in fayalite. The result demonstrates that the phase transformation relaxes stress stored in the sample. Some diffraction peaks of spinel phase, e. g. (400) and (440), were observed to appear prior to the others.
Journal
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- The Review of High Pressure Science and Technology
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The Review of High Pressure Science and Technology 7 272-274, 1998
The Japan Society of High Pressure Science and Technology
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Details 詳細情報について
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- CRID
- 1390001204382283008
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- NII Article ID
- 10002689735
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- NII Book ID
- AN10452913
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- ISSN
- 13481940
- 0917639X
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- NDL BIB ID
- 4493900
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- Text Lang
- en
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed