Phase Transition in SnI4 at High Pressure.

• Sato K.

  Department of Physics, Ochanomizu University

• Hamaya N.

  Department of Physics, Ochanomizu University

Bibliographic Information

Other Title

• Phase Transition in SnI4 at High Pressu

Abstract

Synchrotron x-ray diffraction study of SnI₄ establishes a rich sequence of high-pressure structural transitions; 1st crystalline phase - 2nd crystalline phase - amorphous state - 3rd crystalline phase. Both metallization and amorphization proceed in the newly found 2nd phase stable above 7. 2 GPa. The 3rd crystalline phase exhibits a simple diffraction pattern that can be indexed only with the fcc lattice with the nearest interatomic distance of 3. 003±0. 001 Å at 61 GPa. This short distance is taken as evidence for pressure-induced dissociation of the SnI₄ molecules.

Journal

• The Review of High Pressure Science and Technology

  The Review of High Pressure Science and Technology 7 278-280, 1998

  The Japan Society of High Pressure Science and Technology

Keywords

• synchrotron x-ray diffraction
• Rietveld analysis
• phase transition
• amorphous
• molecular dissociation

Details

• CRID: 1390001204381533056
• NII Article ID: 10002689762
• NII Book ID: AN10452913
• DOI: 10.4131/jshpreview.7.278
• ISSN: 13481940
• ISSN: 0917639X
• NDL BIB ID: 4493902
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4493902
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed