New Technique to In situ Control Oxygen Fugacity in Water-free High Pressure System.

• Li Heping

  Institute of Geochemistry, Chinese Academy of Sciences

• Xie Hongsen

  Institute of Geochemistry, Chinese Academy of Sciences

• Zhang Yueming

  Institute of Geochemistry, Chinese Academy of Sciences

• Guo Jie

  Institute of Geochemistry, Chinese Academy of Sciences

Bibliographic Information

Other Title

• New Technique to In situ Control Oxygen

Abstract

Through inserting an oxygen-specific electrolyte disc inside and exerting a DC (direct current) voltage outside between the sample and an oxygen buffer, oxygen can be poured into or pumped from the sample at a fixed temperature and pressure. By measurement of the voltage between the sample and a reference buffer, the oxygen fugacity in the sample is simultaneously monitored. Therefore, the oxygen fugacity in the sample at high temperature and high pressure can be willfully and in situ adjusted and controlled independently of temperature and pressure.

Journal

• The Review of High Pressure Science and Technology

  The Review of High Pressure Science and Technology 7 1523-1525, 1998

  The Japan Society of High Pressure Science and Technology

Keywords

• new technique
• in-situ control
• oxygen fugacity
• water-free system
• high temperature and high pressure

Details

• CRID: 1390001204380602752
• NII Article ID: 10002694561
• NII Book ID: AN10452913
• DOI: 10.4131/jshpreview.7.1523
• ISSN: 13481940
• ISSN: 0917639X
• NDL BIB ID: 4494287
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4494287
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed