Layered structure analysis of multilayers by X-ray reflectometry using CuKβ line
-
- USAMI K.
- Hitachi Research Lab.
-
- UEDA K.
- Hitachi Research Lab.
-
- HIRANO T.
- Hitachi Research Lab.
-
- HOSHIYA H.
- Central Research Lab.
-
- NARISHIGE S.
- Data Storage & Systems Div. , Hitachi Ltd.
Bibliographic Information
- Other Title
-
- CuKβ-X線反射率法による薄膜積層体の層構造解析
Search this article
Journal
-
- 日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan
-
日本応用磁気学会学術講演概要集 = Digest of ... annual conference on magnetics in Japan 20 51-, 1996-09-01
- Tweet
Details 詳細情報について
-
- CRID
- 1573950398839606272
-
- NII Article ID
- 10002728889
-
- NII Book ID
- AN10269644
-
- Text Lang
- ja
-
- Data Source
-
- CiNii Articles