Properties changes of epitaxial Fe-N films on films thickness

  • OKAMOTO S.
    Research Institute for Scientific Measurements, Tohoku Univ.
  • KITAKAMI Osamu
    Research Institute for Scientific Measurements, Tohoku Univ.
  • SHIMADA Yutaka
    Research Institute for Scientific Measurements, Tohoku Univ.

Bibliographic Information

Other Title
  • エピタキシャルFe-N膜の膜厚依存性

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Details 詳細情報について

  • CRID
    1573387448886129408
  • NII Article ID
    10002729744
  • NII Book ID
    AN10269644
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

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