Growth and microstructural characterization of AnO films on(0001)Al_2O_3 substrate by ECR-assisted MBE
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- KANG H. -B.
- Graduate School of Engineering, Tohoku University
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- NAKAMURA K.
- Graduate School of Engineering, Tohoku University
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- LIM S. -H.
- Institute for Advanced Materials Processing, Tohoku University
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- SHINDO D.
- Institute for Advanced Materials Processing, Tohoku University
Bibliographic Information
- Other Title
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- ECR-MBE法によるZnO圧電膜の成長とその特性
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Journal
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- 日本音響学会研究発表会講演論文集
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日本音響学会研究発表会講演論文集 1998 (2), 1201-1202, 1998-09-01
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Details 詳細情報について
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- CRID
- 1571135649067958784
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- NII Article ID
- 10002749380
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- NII Book ID
- AN00351181
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- ISSN
- 13403168
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- Text Lang
- ja
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- Data Source
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- CiNii Articles