Growth and microstructural characterization of AnO films on(0001)Al_2O_3 substrate by ECR-assisted MBE

  • KANG H. -B.
    Graduate School of Engineering, Tohoku University
  • NAKAMURA K.
    Graduate School of Engineering, Tohoku University
  • LIM S. -H.
    Institute for Advanced Materials Processing, Tohoku University
  • SHINDO D.
    Institute for Advanced Materials Processing, Tohoku University

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Other Title
  • ECR-MBE法によるZnO圧電膜の成長とその特性

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Details 詳細情報について

  • CRID
    1571135649067958784
  • NII Article ID
    10002749380
  • NII Book ID
    AN00351181
  • ISSN
    13403168
  • Text Lang
    ja
  • Data Source
    • CiNii Articles

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