Evaluation of Characteristics of BaTiO<sub>3</sub> Thin Films prepared by Intense, Pulsed, Ion-Beam Evaporation
-
- Sonegawa Tomihiro
- Nagaoka University of Technology
-
- Masugata Katsumi
- Nagaoka University of Technology
-
- Grigoriu Constantin
- Nagaoka University of Technology
-
- Yatsui Kiyoshi
- Nagaoka University of Technology
-
- Shimotori Yutaka
- Nippon Seiki Co.
-
- Furuuchi Sigemasa
- Nippon Seiki Co.
-
- Yamamoto Hiroshi
- Nichicon Co.
Bibliographic Information
- Other Title
-
- 大強度パルスイオンビーム蒸着法で生成されたBaTiO<sub>3</sub>薄膜の特性評価
- 大強度パルスイオンビーム蒸着法で生成されたBaTiO3薄膜の特性評価
- ダイキョウド パルス イオン ビーム ジョウチャクホウ デ セイセイサレタ B
Search this article
Abstract
Cubic barium titanate (BaTiO3) thin films have been successfully prepared in situ on the substrate of Al/SiO2/Si(100) or SiO2/Si(100) by intense, pulsed, ion-beam evaporation technique without heating the substrate. The energy of the ion beam used was typically 1.3 MeV with the power density of 0.6GW/cm2. The deposition rate was observed to be 0.6μm/shot on the substrate placed at the distance, 4cm, from the target. The films prepared were cubic polycrystals and the composition are equivalent to that of the target. The specific dielectric constant was typically observed to be 40 at 1kHz. Relaxation time of dielectric palarization was found to distribute ln the range of 0.3-0.0003s.
Journal
-
- IEEJ Transactions on Fundamentals and Materials
-
IEEJ Transactions on Fundamentals and Materials 116 (8), 738-743, 1996
The Institute of Electrical Engineers of Japan
- Tweet
Keywords
Details 詳細情報について
-
- CRID
- 1390282679576273792
-
- NII Article ID
- 130006839318
- 10007791439
- 10002820123
-
- NII Book ID
- AN10136312
-
- ISSN
- 13475533
- 03854205
-
- NDL BIB ID
- 4003775
-
- Data Source
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- Abstract License Flag
- Disallowed