Influence of Deposit Temperature and Magnetic Field on Properties of NiO/NiFe Films

  • LEE Z. Y.
    Department of Solid State Electronics, Huazhong University of Science and Technology
  • QIU J. J.
    Department of Solid State Electronics, Huazhong University of Science and Technology
  • LIN G. Q.
    Department of Solid State Electronics, Huazhong University of Science and Technology
  • PENG Z. L.
    Department of Solid State Electronics, Huazhong University of Science and Technology
  • LIU X. J.
    Department of Solid State Electronics, Huazhong University of Science and Technology
  • WU D. D.
    Department of Solid State Electronics, Huazhong University of Science and Technology
  • HU Z. Q.
    Department of Solid State Electronics, Huazhong University of Science and Technology
  • XIONG R.
    Department of Solid State Electronics, Huazhong University of Science and Technology

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詳細情報 詳細情報について

  • CRID
    1572261548963948672
  • NII論文ID
    10002824737
  • NII書誌ID
    AN10269644
  • 本文言語コード
    en
  • データソース種別
    • CiNii Articles

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