Fault analysis in the very shallow sismic reflection method (Part3) -Migration-
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- NAGUMO Shozburo
- OYO Corporation
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- MURAOKA Sunao
- OYO Corporation
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- TAKAHASHI Toru
- OYO Corporation
Bibliographic Information
- Other Title
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- 極浅層反射法における断層解析(その3) -マイグレーション-
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Journal
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- 物理探査学会学術講演会講演論文集 = Proceeding of the SEGJ Conference
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物理探査学会学術講演会講演論文集 = Proceeding of the SEGJ Conference 97 161-164, 1997-10
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Details 詳細情報について
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- CRID
- 1572261548964213248
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- NII Article ID
- 10002839129
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- NII Book ID
- AN10532932
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- Text Lang
- ja
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- Data Source
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- CiNii Articles