シアーセル法によるゲルマニウム半導体融液の高精度拡散係数測定技術の開発

• YODA Shinichi

  NASDA

• ODA Hirohisa

  NASDA

• NAKAMURA Tomihisa

  NASDA

• KOSHIKAWA Naokiyo

  NASDA

• MASAKI Tadahiko

  NASDA

• MATSUMOTO Satoshi

  NASDA

• TANJI Akira

  IHI

• ARAI Yoshito

  IHI

• GOTO Kazumasa

  IHI

• TATEIWA Natsumi

  IHI

• KANEKO Minoru

  IJS

Bibliographic Information

Other Title

• Technological Development of highly accurate Diffusion Coefficient Measurement by Shear Cell Method in Germanium Semiconductor Melt

Journal

• JASMA : Journal of the Japan Society of Microgravity Application

  JASMA : Journal of the Japan Society of Microgravity Application 14 71-72, 1997-10-01

Details

• CRID: 1573668923850397184
• NII Article ID: 10002913877
• NII Book ID: AN10537663
• ISSN: 09153616
• Text Lang: en
• Data Source:
  • CiNii Articles