Stress-relaxation of cell walls and the yield threshold for growth : Demonstration and measurement by micropressure prove and psychrometer technique.

1 Citations

Journal

  • Planta

    Planta 162 46-54, 1984

Citations (1)*help

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Details 詳細情報について

  • CRID
    1571698599086177920
  • NII Article ID
    10003337804
  • Data Source
    • CiNii Articles

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