Electrical resistivity structure of the Tanna and the Ukihashi faults

• Electromagnetic Research Group for the Active Fault

収録刊行物

• Bull. Earthq. Res. Inst., Univ. Tokyo

  Bull. Earthq. Res. Inst., Univ. Tokyo 58 265-268, 1983

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• CRID: 1574231873877762944
• NII論文ID: 10003532861
• NII書誌ID: AN00029699
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  • CiNii Articles