Preparation of Nitrogen-Doped ZnSe Thin Films by Radical-Assisted MOCVD

  • Hara Yoshinori
    Department of Materials Science, Faculty of Engineering, Tohoku University
  • Yonekura Hiroshi
    Department of Materials Science, Faculty of Engineering, Tohoku University
  • Noda Yasutoshi
    Department of Materials Science, Faculty of Engineering, Tohoku University

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タイトル別名
  • Preparation of Nitrogen-Doped ZnSe Thin

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Radical-assisted metalorganic chemical vapor deposition of ZnSe thin films was made using nitrogen trifluoride (NF3) as co-reactant and source of nitrogen atoms. The secondary ion mass spectroscopy analysis indicated that the concentration profile of nitrogen in a ZnSe film was not uniform in regard to the thickness and was the order of magnitude of 1025–1026 m−3.<BR>The photoluminescence (PL) spectra of all the films showed weak excitonic emission bound due to the neutral nitrogen atom pair (I1N–N) and intense donor-acceptor pair emission (DAP). The net acceptor concentration obtained from capacitance-voltage measurements was 1.3×1023 m−3 at maximum, which increased to 1.3×1024 m−3 after heat-treatment.

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