Preparation of Nitrogen-Doped ZnSe Thin Films by Radical-Assisted MOCVD
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- Hara Yoshinori
- Department of Materials Science, Faculty of Engineering, Tohoku University
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- Yonekura Hiroshi
- Department of Materials Science, Faculty of Engineering, Tohoku University
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- Noda Yasutoshi
- Department of Materials Science, Faculty of Engineering, Tohoku University
書誌事項
- タイトル別名
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- Preparation of Nitrogen-Doped ZnSe Thin
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Radical-assisted metalorganic chemical vapor deposition of ZnSe thin films was made using nitrogen trifluoride (NF3) as co-reactant and source of nitrogen atoms. The secondary ion mass spectroscopy analysis indicated that the concentration profile of nitrogen in a ZnSe film was not uniform in regard to the thickness and was the order of magnitude of 1025–1026 m−3.<BR>The photoluminescence (PL) spectra of all the films showed weak excitonic emission bound due to the neutral nitrogen atom pair (I1N–N) and intense donor-acceptor pair emission (DAP). The net acceptor concentration obtained from capacitance-voltage measurements was 1.3×1023 m−3 at maximum, which increased to 1.3×1024 m−3 after heat-treatment.
収録刊行物
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- Materials Transactions, JIM
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Materials Transactions, JIM 39 (3), 427-431, 1998
社団法人 日本金属学会
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詳細情報 詳細情報について
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- CRID
- 1390282679223128064
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- NII論文ID
- 130003422562
- 10003802282
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- NII書誌ID
- AA10699969
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- COI
- 1:CAS:528:DyaK1cXivFKgurk%3D
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- ISSN
- 2432471X
- 09161821
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- NDL書誌ID
- 4440484
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可