XPS Study of the Effect of Ar-Ion Bombardment and Aging on Surface Properties of Superionic Conducting Glass (CuI)<SUB>0.3</SUB>(Cu<SUB>2</SUB>O)<SUB>0.35</SUB>(MoO<SUB>3</SUB>)<SUB>0.35</SUB>
-
- Suzuki Shigeru
- Institute for Advanced Materials Processing, Tohoku University
-
- Saito Masatoshi
- Institute for Advanced Materials Processing, Tohoku University
-
- Kang Shinchul C.
- Institute for Advanced Materials Processing, Tohoku University
-
- Jacob Kallarackel T.
- Institute for Advanced Materials Processing, Tohoku University
-
- Waseda Yoshio
- Institute for Advanced Materials Processing, Tohoku University
Bibliographic Information
- Other Title
-
- XPS Study of the Effect of Ar-Ion Bombardment and Aging on Surface Properties of Superionic Conducting Glass (CuI)0.3(Cu2O)0.35(MoO3)0.35
- XPS Study of the Effect of Ar-Ion Bomba
Search this article
Abstract
XPS analysis has been used for characterizing the effects of argon-ion bombardment and aging at room temperature on the surface properties of the superionic conducting glass having the composition (CuI)0.3(Cu2O)0.35(MoO3)0.35. Copper and molybdenum ions in this particular glass are found to be significantly reduced by argon-ion bombardment, Cu2+ to Cu0 and Mo6+ to Mo4+. The chemical change is attributed to preferential sputtering of iodine and oxygen from the surface of the glass. The concentration of copper on the surface increases and that of molybdenum decreases with aging at room temperature. From aging curves, the diffusion coefficient of copper is estimated to be of the order of 10−23 m2·s−1.
Journal
-
- Materials Transactions, JIM
-
Materials Transactions, JIM 39 (10), 1024-1028, 1998
The Japan Institute of Metals
- Tweet
Keywords
Details
-
- CRID
- 1390282679224762624
-
- NII Article ID
- 130003556984
- 10003804299
-
- NII Book ID
- AA10699969
-
- COI
- 1:CAS:528:DyaK1MXnsFyq
-
- ISSN
- 2432471X
- 09161821
-
- NDL BIB ID
- 4587175
-
- Text Lang
- en
-
- Data Source
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- Abstract License Flag
- Disallowed