Study of High Resolution TEM Images of Nanoparticles either Supported on Amorphous Films or Embedded in a Crystalline Matrix

• Yacamán M. José

  Instituto Nacional de Investigaciones Nucleares Instituto de Física, Universidad Nacional Autónoma de México

• Zorrilla C.

  Instituto de Física, Universidad Nacional Autónoma de México

• Ascencio J. A.

  Instituto Nacional de Investigaciones Nucleares

• Mondragón G.

  Instituto Nacional de Investigaciones Nucleares

• Reyes-Gasga J.

  Instituto Nacional de Investigaciones Nucleares Instituto de Física, Universidad Nacional Autónoma de México

抄録

The contrast analysis of HREM images for nanoparticles supported in an amorphous substrate is studied. The particular case when these particles are embedded in a crystalline matrix is discussed. It is demonstrated that, depending on the substrate thickness, the particle contrast can show contrast artifacts along their edges. In some cases for thick substrates the particle image can even disappear. The contrast observed from particles embedded in a crystalline structure can fluctuate from invisibility to highly contrasted Moiré patterns.

収録刊行物

• Materials Transactions, JIM

  Materials Transactions, JIM 40 (2), 141-145, 1999

  社団法人 日本金属学会

キーワード

• nanoparticles
• electron microscopy
• nanostructured materials

詳細情報

• CRID: 1390282679223096064
• NII論文ID: 130003557163
• NII論文ID: 10003805600
• NII書誌ID: AA10699969
• DOI: 10.2320/matertrans1989.40.141
• COI: 1:CAS:528:DyaK1MXisVWru74%3D
• ISSN: 2432471X
• ISSN: 09161821
• NDL書誌ID: 4658784
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4658784
• Web Site: https://www.jstage.jst.go.jp/article/matertrans1989/40/2/40_2_141/_pdf
• 本文言語コード: en
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可