書誌事項
- タイトル別名
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- In-situ Nanoscopic Visualization of Localized Corrosion by Scanning Probe Microscopes.
- ソウサガタ プローブ ケンビキョウ ニ ヨル キョクブ フショク ノ ナノメー
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抄録
This investigation demonstrates that scanning tunneling microscopy (STM) and atomic force microscopy (AFM) (scanning probe microscopy) are capable of performing in-situ nanoscopic visualization of initiation and growth processes of localized corrosion in aqueous solutions. We discuss advantage and disadvantage of STM and AFM for in-situ visualization in aqueous solutions: an AFM is more suitable compared with an STM for in-situ visualization of localized corrosion damage, from the standpoints of scanning speed, stability and capability of imaging non-conducting surface of corrosion products. The nanoscopic initiation and growth mechanisms of localized corrosion of pitting corrosion and intergranular corrosion of a sensitized austenitic stainless steel and 7XXX series aluminum alloys are discussed based upon nanoscopic in-situ visualization by using STM/AFM.
収録刊行物
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- 材料
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材料 43 (486), 329-335, 1994
公益社団法人 日本材料学会
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390282680370063616
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- NII論文ID
- 110002294129
- 10003922972
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- NII書誌ID
- AN00096175
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- COI
- 1:CAS:528:DyaK2cXkvV2isL8%3D
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- ISSN
- 18807488
- 05145163
- http://id.crossref.org/issn/05145163
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- NDL書誌ID
- 3859404
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可