Use of Co-axial CT and Planer Bus to Improve IGBT Device Characterization

• BRAUN D.

収録刊行物

• IEEE IAS'96

  IEEE IAS'96 1507-1516, 1996

詳細情報

• CRID: 1574231873940792832
• NII論文ID: 10004069963
• NII書誌ID: BA29460516
• データソース種別:
  • CiNii Articles