Fault Location in SF6 Insulated Conductors using Direct Fluxgate Magnetometry

• ITANI A. M.

収録刊行物

• IEEE PES 1982 Summer Meeting Paper

  IEEE PES 1982 Summer Meeting Paper (82), SM335-8,

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• CRID: 1571698599168096896
• NII論文ID: 10004222533
• データソース種別:
  • CiNii Articles