Reexamination of Fine Surface Topography of Nerve Cells Revealed by Atomic Force Microscopy

• Tojima Takuro

  Divisions of Biological Sciences, Graduate School of Science, Hokkaido University

• Hatakeyama Dai

  Divisions of Biological Sciences, Graduate School of Science, Hokkaido University

• Kawabata Kazushige

  Divisions of Biological Physics, Graduate School of Science, Hokkaido University

• Abe Kazuhiro

  Department of Anatomy, Hokkaido University Graduate School of Medicine

• lto Etsuro

  Divisions of Biological Sciences, Graduate School of Science, Hokkaido University

抄録

We prove in the present study that atomic force microscopy (AFM) excels scanning electron microscopy (SEM) in revealing three-dimensionally the fine structures of cell surfaces. When the AFM images were compared between the metal-coated and non-metal-coated surfaces of the nerve cells, the finer structures of surfaces were detected in the non-metal-coated cell surfaces. This result clearly showed that metal coating for preparing the SEM samples loses fine information that the AFM can easily obtain from the non-metal-coated cells. The fine surface structures revealed by the AFM were thought to be a reflection of the cytoskeletal network, for example actin organization in growth cones. Such advantages of the AFM should be utilized in wider ranges of morphological studies.

収録刊行物

• bioimages

  bioimages 7 (2), 89-94, 1999

  日本バイオイメージング学会

キーワード

• atomic force microscopy
• scanning electron microscopy
• metal coating
• NG108-15 cell
• growth cone
• actin filament

詳細情報

• CRID: 1390566775137320192
• NII論文ID: 10004285021
• NII書誌ID: AA11084187
• DOI: 10.11169/bioimages.7.89
• ISSN: 09192719
• 本文言語コード: en
• データソース種別:
  • JaLC
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可