Ion-Shadow Sputter for the Production of STM Tips

• ARITA Masashi

  Graduate School of Engineering, Hokkaido University

• TAKEI Ryutaro

  Graduate School of Engineering, Hokkaido University

• YOSHIDA Masayuki

  Graduate School of Engineering, Hokkaido University

• HAMADA Kouichi

  Graduate School of Engineering, Hokkaido University

• OKADA Akira

  Graduate School of Engineering, Hokkaido University

• MUKASA Koichi

  Graduate School of Engineering, Hokkaido University, CREST, Japan Science and Technology Corpporation (JST), Graduate School of Engineering, Hokkaido University

• TAKAHASHI Heishichiro

  Center for Advanced Research of Energy Technology, Hokkaido University

Journal

• International journal of the Japan Society for Precision Engineering

  International journal of the Japan Society for Precision Engineering 33 (3), 215-217, 1999-09-30

Keywords

• ion-shadow sputter
• scanning tunneling microscope
• silicon tip
• transmission electron microscopy
• morphology

Details

• CRID: 1571698599162371712
• NII Article ID: 10004294703
• NII Book ID: AA1080710X
• ISSN: 0916782X
• Text Lang: en
• Data Source:
  • CiNii Articles