Application of the Attenuated-Total-Reflection Technique to the Measurement of Silica-Gel Particle Size

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著者

    • YOSHIDOME Toshifumi
    • Department of Applied Chemistry and Chemical Engineering, Faculty of Engineering, Kagoshima University
    • KUSUMOTO Hiroki
    • Department of Applied Chemistry and Chemical Engineering, Faculty of Engineering, Kagoshima University
    • KAMATA Satsuo
    • Department of Applied Chemistry and Chemical Engineering, Faculty of Engineering, Kagoshima University

抄録

Attenuated-total-reflection (ATR) spectra of thinly deposited silica-gel particles measuring several microns in diameter were measured. The band intensity increased monotonously with decreasing the particle diameter as expected from the characteristic of the evanescent wave. The silica-gel particle size was proved to be determined by use of the ATR technique.

収録刊行物

  • Chemistry letters  

    Chemistry letters 1998(8), 747-748, 1998-08-05 

    The Chemical Society of Japan

参考文献:  7件

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各種コード

  • NII論文ID(NAID)
    10004484156
  • NII書誌ID(NCID)
    AA00603318
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    03667022
  • データ提供元
    CJP書誌  J-STAGE 
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