A dislocation wake along a crack in Si at the DBTT

• SUPRIJADI

  Dept.of Quantum Engg., Nagoya Univ.

• SAKA H.

  Dept.of Quantum Engg., Nagoya Univ.

Bibliographic Information

Other Title

• DBTTでSi中における亀裂に沿った転位の発生

Journal

• 電子顕微鏡

  電子顕微鏡 34 113-, 1999-05-01

Details

• CRID: 1570291224322012544
• NII Article ID: 10004538889
• NII Book ID: AN00145000
• ISSN: 04170326
• Text Lang: ja
• Data Source:
  • CiNii Articles