Examination of Applicability of Phase Only Correlation method to TEM Automatic Focusing

• TSUNETA R.

  Central Research.Laboratory, Hitachi, Ltd.

• KOUGUCHI M.

  Central Research.Laboratory, Hitachi, Ltd.

• KAKIBAYASHI H.

  Central Research.Laboratory, Hitachi, Ltd.

• NAGAOKI I.

  Instrument.Division., Hitachi Ltd.

• OHTSUKA H.

  Instrument.Division., Hitachi Ltd.

• INADA S.H.

  Instrument.Division., Hitachi Ltd.

• KOBAYASHI H.

  Instrument.Division., Hitachi Ltd.

• KOBAYASHI K.

  New Business Development Center, Yamatake Corporation

• HIGUCHI K.

  New Business Development Center, Yamatake Corporation

Bibliographic Information

Other Title

• 位相限定相関法のTEM自動焦点解析への適用性の検討

Journal

• 電子顕微鏡

  電子顕微鏡 34 117-, 1999-05-01

Details

• CRID: 1570291224322093056
• NII Article ID: 10004538901
• NII Book ID: AN00145000
• ISSN: 04170326
• Text Lang: ja
• Data Source:
  • CiNii Articles