An evaluation of the Analysis Depth of the X-ray Analytical Microscopy
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- YURUGI Toshikazu
- HORIBA, Ltd.
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- ISHIKAWA Sumiyo
- HORIBA, Ltd.
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- YOSHIMITSU Katsuhiro
- HORIBA, Ltd.
Bibliographic Information
- Other Title
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- X線分析顕微鏡による分析深さの評価
Search this article
Journal
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- 電子顕微鏡
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電子顕微鏡 34 175-, 1999-05-01
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Details 詳細情報について
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- CRID
- 1571135649251863168
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- NII Article ID
- 10004539051
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- NII Book ID
- AN00145000
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- ISSN
- 04170326
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- Text Lang
- ja
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- Data Source
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- CiNii Articles