Super high resolution observation of high purity SiC grain boundary

• TAKUMA E.

  Dept.of Material Science, Tokyo Univ.

• KOSHIMIZU T.

  Dept.of Material Science, Tokyo Univ.

• ICHINOSE H.

  Dept.of Material Science, Tokyo Univ.

Bibliographic Information

Other Title

• 高純度SiC粒界の超高分解能観察

Journal

• 電子顕微鏡

  電子顕微鏡 34 190-, 1999-05-01

Details

• CRID: 1573105974088833792
• NII Article ID: 10004539091
• NII Book ID: AN00145000
• ISSN: 04170326
• Text Lang: ja
• Data Source:
  • CiNii Articles