Angular Dependence of B-K Edges in EELS

• LEE Y.-S.

  Institute for Advanced Materials Processing, Tohoku University

• MURAKAMI Y.

  Institute for Advanced Materials Processing, Tohoku University

• SHINDO D.

  Institute for Advanced Materials Processing, Tohoku University

• OIKAWA T.

  JEOL Ltd.

収録刊行物

• 電子顕微鏡

  電子顕微鏡 34 228-, 1999-05-01

詳細情報

• CRID: 1571417124228510336
• NII論文ID: 10004539170
• NII書誌ID: AN00145000
• ISSN: 04170326
• 本文言語コード: en
• データソース種別:
  • CiNii Articles