On the Advantages of Scanning Near Field Optical Microscopy combined with conventional Light Microscopy

• WIEGRABE Winfried

  Carl Zeiss Jena GmbH, Microdetection Systems

• HELD Nicole

  Carl Zeiss Jena GmbH, Microdetection Systems

• KNOBLOCH Harald

  Carl Zeiss Japan Co., Ltd.

収録刊行物

• 電子顕微鏡

  電子顕微鏡 34 250-, 1999-05-01

詳細情報

• CRID: 1573668924042178176
• NII論文ID: 10004539218
• NII書誌ID: AN00145000
• ISSN: 04170326
• 本文言語コード: en
• データソース種別:
  • CiNii Articles