Grain Orientation Measurement by Electron Back Scatter Diffractometry

• YAMAMOTO T.

  Dept.of Materials Science, The University of Tokyo

Bibliographic Information

Other Title

• EBSDを用いた結晶粒方位測定

Journal

• 電子顕微鏡

  電子顕微鏡 34 320-, 1999-05-01

Details

• CRID: 1573105974088794624
• NII Article ID: 10004539327
• NII Book ID: AN00145000
• ISSN: 04170326
• Text Lang: ja
• Data Source:
  • CiNii Articles