Crack Morphology in Bend-forming of TiN-coated Single Crystal of Goss-Oriented Silicon Steel Sheet.

• INOKUTI Yukio

  Research Laboratories, Kawasaki Steel Corp

Bibliographic Information

Other Title

• ＴｉＮ被覆ゴス珪素鋼板中に成長した単結晶の曲げ変形後のクラックの発生状況
• TIN ヒフク ゴス ケイソ コウハン チュウ ニ セイチョウ シタ タンケッショウ ノ マゲ ヘンケイ ゴ ノ クラック ノ ハッセイ ジョウキョウ

Abstract

In order to clarify the crack morphology in 180° bend-forming of the TiN film deposited on (011) [100] single crystals of silicon steel, TiN coating by the hollow cathode discharge (HCD) method was done on a polished (011) [100] single crystal sample. The TiN-coated samples were 180° bend-formed and observed by the scanning electron microscope.<BR>In the position (a) just above 180° bend-forming, TiN film showed the straight crack at the interval of 2-4 μm parallel to the direction of [121] _TiN. In contrast, in the position (b) near the transition zone from bend-forming to tensioning, TiN film showed an elliptical morphology 23-30 μm long and 9-12 μm wide.<BR>The point of origin of a small TiN crack can be seen near the center of the ellipse, and the straight crack in the TiN film will propagate from this origin.<BR>It should be noted that the TiN crack morphology differed remarkably depending on the positions of bend-forming.

Journal

• Shinku

  Shinku 43 (7), 741-744, 2000

  The Vacuum Society of Japan

Keywords

• Electrical and Electronic Engineering
• Surfaces, Coatings and Films
• Condensed Matter Physics

Details

• CRID: 1390282679040136960
• NII Article ID: 10004562606
• NII Book ID: AN00119871
• DOI: 10.3131/jvsj.43.741
• ISSN: 18809413
• ISSN: 05598516
• NDL BIB ID: 5432356
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I5432356
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed