A Clean GaP(001)4×2/c(8×2)Surface Structure Studied by Scanning Tunneling Microscopy and Ion Scattering Spectroscopy
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- Naitoh Masamichi
- Department of Electrical Engineering, Kyushu Institute of Technology, 1–1 Sensui, Tobata, Kitakyushu, Fukuoka 804, Japan
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- Watanabe Akihiko
- Department of Electrical Engineering, Kyushu Institute of Technology, 1–1 Sensui, Tobata, Kitakyushu, Fukuoka 804, Japan
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- Konishi Akira
- Department of Electrical Engineering, Kyushu Institute of Technology, 1–1 Sensui, Tobata, Kitakyushu, Fukuoka 804, Japan
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- Nishigaki Satoshi
- Department of Electrical Engineering, Kyushu Institute of Technology, 1–1 Sensui, Tobata, Kitakyushu, Fukuoka 804, Japan
書誌事項
- タイトル別名
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- A Clean GaP(001)4*2/c(8*2) Surface Structure Studied by Scanning Tunneling Microscopy and Ion Scattering Spectroscopy.
- Clean GaP 001 4 2 c 8 2 Surface Structu
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抄録
We report the results of scanning tunneling microscopy and ion scattering spectroscopy investigation on the structure of GaP(001)4×2/c(8×2) surfaces prepared by ion bombardment and annealing methods. We found that the unit cell of the 4×2 structure consists of two Ga dimers with two dimer vacancies and that the atomic separation in the Ga dimer is about 0.27 ± 0.01 nm.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 35 (9A), 4789-4790, 1996
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390282681226820736
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- NII論文ID
- 10004613471
- 210000039695
- 130004522819
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- NII書誌ID
- AA10457675
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- COI
- 1:CAS:528:DyaK28XmtVKhtbg%3D
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 4060169
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可