キャパシタンスXAFS法 -結晶欠陥・表面・界面の選択的構造解析- Capacitance XAFS Method : Site-Selective Analysis of Defect, Surface and Interface

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For local structure analyses of low dimensional structures in semiconductors, such as defects, interfaces and surfaces, a new site-selective x-ray absorption fine structure (XAFS) measurement, ′capacitance XAFS′method, is proposed. In this method, the x-ray photon energy dependence of a capacitance involved in various diode structures is measured. The capacitance is changed by an x-ray induced photoemission of a localized electron trapped in the low dimensional structures. Since the photoemission originates from the x-ray absorption of only the low dimensional structures, the site-selective analysis may be realized. Experiments using Schottky barrier diodes of A1GaAs: Se with a defect, ′DX center′, successfully indicate the site-selective XAFS spectra of the defect atom.

収録刊行物

  • 日本結晶学会誌

    日本結晶学会誌 42(4), 372-376, 2000-08-31

    The Crystallographic Society of Japan

参考文献:  10件中 1-10件 を表示

  • <no title>

    ISHII M.

    Appl. Phys. Lett. 74, 2672, 1999

    被引用文献7件

  • <no title>

    ISHII M.

    Physica B 273-274, 774, 1999

    被引用文献1件

  • <no title>

    MIZUTA M.

    Phys. Rev. B 37, 1043, 1988

    被引用文献1件

  • <no title>

    KAWAJIMA Y.

    J. Appl. Phys. 69, 1429, 1991

    被引用文献1件

  • <no title>

    LIN J. Y.

    Phys. Rev. B 42, 5855, 1990

    被引用文献2件

  • <no title>

    CHADI D. J.

    Phys. Rev. B39, 10063, 1989

    被引用文献5件

  • <no title>

    YAMAGUCHI E.

    J. Phys. Soc. Jpn. 60, 3093, 1991

    被引用文献4件

  • <no title>

    OYANAGI H.

    J. Synchrotron Rad. 7, 89, 2000

    被引用文献6件

  • <no title>

    TAKARABE K.

    Phys. Status Solidi B 198, 187, 1996

    被引用文献1件

  • <no title>

    PARK C. H.

    Phys. Rev. B 15, R14246, 1996

    被引用文献1件

各種コード

  • NII論文ID(NAID)
    10004673786
  • NII書誌ID(NCID)
    AN00188364
  • 本文言語コード
    JPN
  • 資料種別
    ART
  • ISSN
    03694585
  • NDL 記事登録ID
    5466863
  • NDL 雑誌分類
    ZM46(科学技術--地球科学--岩石・鉱物・鉱床)
  • NDL 請求記号
    Z15-138
  • データ提供元
    CJP書誌  NDL  J-STAGE 
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