Femtosecond Transient Reflecting Grating Methods and Analysis of the Ultrafast Carrier Dynamics on Si(111) Surfaces.

MORISHITA Tomohiro, HIBARA Akihide, SAWADA Tsuguo, TSUYUMOTO Isao, HARATA Akira

doi:10.2116/analsci.16.403

Femtosecond Transient Reflecting Grating Methods and Analysis of the Ultrafast Carrier Dynamics on Si(111) Surfaces.

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MORISHITA Tomohiro

Department of Applied Chemistry, School of Engineering, The University of Tokyo
HIBARA Akihide

Department of Applied Chemistry, School of Engineering, The University of Tokyo
SAWADA Tsuguo

Department of Applied Chemistry, School of Engineering, The University of Tokyo
TSUYUMOTO Isao

Department of Environmental Systems Engineering, Kanazawa Institute of Technology
HARATA Akira

Department of Molecular Science and Technology, Graduate School of Engineering Science, Kyushu University

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The femtosecond transient reflecting grating (TRG) method was developed and applied to monitor the ultrafast dynamics of photo-excited carriers on Si(111) surfaces. TRG responses were measured as a function of the pump beam intensity and fringe spacing, and two relaxation components were observed. An analysis of the results has suggested that the slow component corresponds to carrier diffusion and that the fast component corresponds to a combined process between ballistic transport and carrier-carrier scattering of non-equilibrium carriers.