赤外線ニ次元ロックインアンプによる高分子材内部の欠陥検出 Detecting Defects in Polymer Plates by using an Infrared 2-D Lock-in Amplifier System

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We have developed a two-dimensional lock-in amplifier system which can detect very small changes in images and can be used to detect subsurface defects in polymer plates nondestructively. This system uses modulated lights to heat and to cool the polymer surfaces. If there is a defect in the subsurface, heat conduction is disturbed at the edges of the defect. The subsurface defect should be identified by the observation of the localized variant temperature variation region on the surface. The temperature distribution can be observed by using an infrared thermography, and the variation can be detected by using a two-dimensional lock-in amplifier system. This inexpensive measurement system should therefore be very useful in detecting small defects in various polymers, rapidly, nondestructively, and without any contact.

収録刊行物

  • 電気学会論文誌. E, センサ・マイクロマシン準部門誌 = The transactions of the Institute of Electrical Engineers of Japan. A publication of Sensors and Micromachines Society  

    電気学会論文誌. E, センサ・マイクロマシン準部門誌 = The transactions of the Institute of Electrical Engineers of Japan. A publication of Sensors and Micromachines Society 117(12), 600-606, 1997-12-01 

    The Institute of Electrical Engineers of Japan

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各種コード

  • NII論文ID(NAID)
    10004832812
  • NII書誌ID(NCID)
    AN1052634X
  • 本文言語コード
    JPN
  • 資料種別
    ART
  • ISSN
    13418939
  • NDL 記事登録ID
    4353771
  • NDL 雑誌分類
    ZN31(科学技術--電気工学・電気機械工業)
  • NDL 請求記号
    Z16-B380
  • データ提供元
    CJP書誌  CJP引用  NDL  J-STAGE 
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