Piezoresistive Property of p-type CVD Diamond Films
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- Deguchi Masahiro
- Matsushita Electric Industrial Co., Ltd.
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- Kitabatake Makoto
- Matsushita Electric Industrial Co., Ltd.
Bibliographic Information
- Other Title
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- p形CVDダイヤモンド膜のピエゾ抵抗効果特性
- pガタ CVD ダイヤモンド マク ノ ピエゾ テイコウ コウカ トクセイ
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Abstract
Electrical and piezoresistive properties of chemical-vapor-deposited boron-doped p-type polycrystalline diamond films were investigated. The p-type polycrystalline diamond films of about 2μm thickness were grown on a flat insulating polycrystalline diamond layer using a conventional microwave plasma CVD system. The p-type CVD diamond film exhibited similar quality as homoepitaxial single crystalline diamond film with activation energy of 0.31-0.33eV. Piezoresistor (500μm long and 50μm wide) constituted from the optimized p-type polycrystalline diamond films were fabricated on diaphragm structure using photolithography and reactive-ion etching in an oxygen plasma. Relative change of the electrical resistance (-ΔR/R0) of the diamond piezoresistor was almost proportional to the apphed strain ε, Gauge factor K for the p-type diamond piezoresistor was derived to be about 1000 at room temperature and above 700 even at 473K.
Journal
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- IEEJ Transactions on Sensors and Micromachines
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IEEJ Transactions on Sensors and Micromachines 117 (12), 617-621, 1997
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390282679438949632
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- NII Article ID
- 10004832836
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- NII Book ID
- AN1052634X
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- ISSN
- 13475525
- 13418939
- http://id.crossref.org/issn/13418939
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- NDL BIB ID
- 4353774
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed