Non Destructive Testing using the SQUID with Integrated Gradiometer

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We have used the integrated SQUID gradiometer in an unshielded environment to make eddy current nondestructive testing measurement on a multi-layer aluminum structure. The sensor consists of a niobium dc superconducting quantum interference device (SQUID) and a first-order gradiometer pick up coil on the same substrate. As a demonstration of their capabilities, subsurface defects in a multilayer aluminum structure have been located and mapped using eddy current with no magnetic shielding around the specimen or cryostat.

収録刊行物

  • 電気学会論文誌. E, センサ・マイクロマシン準部門誌 = The transactions of the Institute of Electrical Engineers of Japan. A publication of Sensors and Micromachines Society

    電気学会論文誌. E, センサ・マイクロマシン準部門誌 = The transactions of the Institute of Electrical Engineers of Japan. A publication of Sensors and Micromachines Society 118(1), 37-41, 1998-01

    The Institute of Electrical Engineers of Japan

参考文献:  7件中 1-7件 を表示

  • <no title>

    DIXON T. E.

    INSIGHT 36, 256, 1994

    被引用文献1件

  • <no title>

    WIKSWO Jr.

    IEEE Trans.Appl.Sup. 5, 74, 1995

    被引用文献1件

  • <no title>

    CHINONE K.

    IEEE Trans.Appl.Sup. 7, 3271, 1997

    被引用文献1件

  • <no title>

    HUTSON D.

    IEEE Trans. Appl. Supercond. 6, 2295, 1995

    被引用文献1件

  • <no title>

    KLEIN U.

    Supercond. Sci. Technol. 9, 1, 1996

    被引用文献1件

  • <no title>

    WALKER M. E.

    Appl. Phys. Lett. 71, 131, 1997

    被引用文献1件

  • <no title>

    COCHRAN A.

    IEEE Trans.Appl.Supercond. 4, 128, 1994

    被引用文献2件

被引用文献:  1件中 1-1件 を表示

各種コード

  • NII論文ID(NAID)
    10004832962
  • NII書誌ID(NCID)
    AN1052634X
  • 本文言語コード
    ENG
  • 資料種別
    ART
  • ISSN
    13418939
  • NDL 記事登録ID
    4366753
  • NDL 雑誌分類
    ZN31(科学技術--電気工学・電気機械工業)
  • NDL 請求記号
    Z16-B380
  • データ提供元
    CJP書誌  CJP引用  NDL  J-STAGE 
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