Non Destructive Testing using the SQUID with Integrated Gradiometer

• Nakane H.

  Department. of Electrical and Electronic Engineering, Muroran Institute of Technology

• Adachi H.

  Department. of Electrical and Electronic Engineering, Muroran Institute of Technology

• Walker M.

  Department of Physics and Applied Physics, University of Strathclyde

• Klein U.

  Department of Physics and Applied Physics, University of Strathclyde

書誌事項

タイトル別名

• Non Destructive Testing using the SQUID

抄録

We have used the integrated SQUID gradiometer in an unshielded environment to make eddy current nondestructive testing measurement on a multi-layer aluminum structure. The sensor consists of a niobium dc superconducting quantum interference device (SQUID) and a first-order gradiometer pick up coil on the same substrate. As a demonstration of their capabilities, subsurface defects in a multilayer aluminum structure have been located and mapped using eddy current with no magnetic shielding around the specimen or cryostat.

収録刊行物

• 電気学会論文誌Ｅ（センサ・マイクロマシン部門誌）

  電気学会論文誌Ｅ（センサ・マイクロマシン部門誌） 118 (1), 37-41, 1998

  一般社団法人 電気学会

キーワード

• eddy current nondestructive testing
• SQUID
• integrated SQUID gradiometer
• unshielded environment
• multi-layer structure

詳細情報

• CRID: 1390001204462725376
• NII論文ID: 10004832962
• NII書誌ID: AN1052634X
• DOI: 10.1541/ieejsmas.118.37
• ISSN: 13475525
• ISSN: 13418939
• HANDLE: 10258/1585
• NDL書誌ID: 4366753
• Web Site: https://muroran-it.repo.nii.ac.jp/records/5691
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4366753
• Web Site: http://www.jstage.jst.go.jp/article/ieejsmas1995/118/1/118_1_37/_pdf
• 本文言語コード: en
• データソース種別:
  • JaLC
  • IRDB
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可