Preparation and Characterization of Sol-Gel Derived PZT Thin Films for Micro Actuators
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- Wang Zhan-jie
- Mechanical Engineering Laboratory, AIST. MITI.
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- Maeda Ryutaro
- Mechanical Engineering Laboratory, AIST. MITI.
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- Kaoru Kikuchi
- Mechanical Engineering Laboratory, AIST. MITI.
Bibliographic Information
- Other Title
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- マイクロ・アクチュエータのためのゾルーゲル法によるPZT積層膜の作製と評価
- マイクロ アクチュエータ ノ タメ ノ ゾル ゲルホウ ニ ヨル PZT セキソウ マク ノ サクセイ ト ヒョウカ
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Abstract
The Pb(Zr1-xTix)O3, (PZT) of thickness of 3μm was fabricated using Sol-Gel spinning-coating onto Pt/Ti/SiO2/Si substrates. The preferred orientation of the PZT films was observed using X-ray diffraction analysis (XRD) and the microstructure was investigated using scanning electron microscopy (SEM). The preferred orientations in the direction of the (100) plane were obtained using the treatment for pyrolysis at 573K and for crystallization at 823K. The present PZT films showed dielectric constants about 1200. Ferroelectricity of these films was established with the values of the remnant polarization of 12.5μC/cm2 and the coercive field of 29.0kV/cm.
Journal
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- IEEJ Transactions on Sensors and Micromachines
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IEEJ Transactions on Sensors and Micromachines 119 (4), 254-259, 1999
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1390282679438610944
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- NII Article ID
- 10004833885
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- NII Book ID
- AN1052634X
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- ISSN
- 13475525
- 13418939
- http://id.crossref.org/issn/13418939
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- NDL BIB ID
- 4705272
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed