低コヒーレント光干渉による面内複屈折測定 [in Japanese] Birefringence Measurement by Low Coherence Interferometry [in Japanese]
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We proposed and demonstrated a practical method for simultaneous measurement of the refractive index and the thickness of a transparent plate, based on the low coherence interferometry. This paper suggests that our method is applicable for birefringence measurement using unpolarized light source. Small birefringence of thin medium such as LiTaO<sub>3</sub> crystal is measured with high accuracy, by introducing dispersion compensation into the low coherence interferometry.
- The Journal of the Institute of Electrical Engineers of Japan
The Journal of the Institute of Electrical Engineers of Japan 119(6), 315-320, 1999-06
The Institute of Electrical Engineers of Japan