Ｘｅｎｏ　ＣＦの歯質接合界面のＦＥ‐ＳＥＭ観察ならびにフッ素徐放性について

• 杉崎 順平

  虎の門病院歯科

• 山田 敏元

  虎の門病院歯科

書誌事項

タイトル別名

• FE-SEM Observation on the Interfacial Ultrastructure and Fluoride-releasing Properties of Xeno CF Restorative System.

抄録

The purpose of this study was to observe the interfacial ultrastructure between the intact teeth or caries-affected dentin and resin with a newly designed one step total priming and bonding system, “Xeno CF” by using FE-SEM, and to determine the depth of fluoride-release into the underneath dentin at one week after bonding.<BR>Tight adhesion was obtained between the intact teeth or caries-affected dentin and resin, and the hybrid layer about 1μm thick was observed at the resin-dentin interface.<BR>Furthermore, the fluoride was detected up to 10μm depth under the resin-dentin interface.This system was expected to be clinically useful according to its simple procedure, tightadhesion to tooth tissue, and fluoride release.

収録刊行物

• 接着歯学

  接着歯学 18 (2), 100-108, 2000

  日本接着歯学会

キーワード

• ワンステップボンディング
• 歯質接着性
• フッ素徐放性
• ハイブリッド層

詳細情報

• CRID: 1390282679324265984
• NII論文ID: 130004047904
• NII論文ID: 10008175676
• NII書誌ID: AN10044236
• DOI: 10.11297/adhesdent1983.18.100
• ISSN: 21859566
• ISSN: 09131655
• Web Site: https://search.jamas.or.jp/link/ui/2001033013
• 本文言語コード: ja
• データソース種別:
  • JaLC
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可