Performance limiting surface defects in SiC epitaxial p-n junction diodes

• Kimoto, T

• Miyamoto, N

• Matsunami, H

収録刊行物

• IEEE TRANSACTIONS ON ELECTRON DEVICES

  IEEE TRANSACTIONS ON ELECTRON DEVICES 46 (3), 471-477, 1999-03

  IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

詳細情報

• CRID: 1050282677085316608
• NII論文ID: 10008217088
• ISSN: 00189383
• HANDLE: 2433/39982
• 本文言語コード: en
• 資料種別: journal article
• データソース種別:
  • IRDB
  • CiNii Articles