Local Characterization of Material using an Impulse-S.A.M. Technique in the 1OMHz-2OMHz

• TRADY F.

収録刊行物

• Proc. of 14th World Conf. on NDT

  Proc. of 14th World Conf. on NDT 4 2321-2324, 1996

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• NII論文ID: 10008647459
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