Combined use of lattice imaging and microanalysis in structure determination of AIN-related polytypes by a 400 kV high-resolution analytical electron microscope

• BANDO Y.

収録刊行物

• Analytical electron microscopy

  Analytical electron microscopy 109-112, 1987

  San Francisco Press

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• CRID: 1573105974520980096
• NII論文ID: 10008808625
• データソース種別:
  • CiNii Articles