Application of a high-resolution STEM to materials science

• BROWN L. M.

収録刊行物

• Scanning electron microscopy/1976

  Scanning electron microscopy/1976 353-360, 1976

  IIT Research Inst

詳細情報

• CRID: 1573668924474397440
• NII論文ID: 10008809742
• データソース種別:
  • CiNii Articles