New Trends in STEM-Based Nano-EELS Analysis

• Christian Colliex

Bibliographic Information

Other Title

• New Trends in STEM-Based Nano-EELS Anal
• Special Issue:Structure Analysis by Using nm-Sized Electron Probe Techniques and Advanced Electron Microscopy
• Special Issue Structure Analysis by Usi

Journal

• Journal of electron microscopy

  Journal of electron microscopy 45 (1), 44-50, 1996

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Details

• CRID: 1523951029735311104
• NII Article ID: 10008809900
• NII Book ID: AA00697060
• ISSN: 00220744
• NDL BIB ID: 3951120
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I3951120
• Text Lang: en
• NDL Source Classification:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• Data Source:
  • NDL
  • CiNii Articles