Resolution enhancement by deconvolution using a field emission source in electron energy loss spectroscopy

• BATSON P. E.

収録刊行物

• Ultramicroscopy

  Ultramicroscopy 41 137-145, 1992

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• CRID: 1573105974520955904
• NII論文ID: 10008809928
• データソース種別:
  • CiNii Articles