UHV specimen-preparation chamber for cluster studies attached to nano-probe high resolution electron microscopes

• TANAKA N.

収録刊行物

• Proceedings of the 13th international congress on electron microscopy

  Proceedings of the 13th international congress on electron microscopy 2 381-382, 1994

  Publication Commitee on the XIIIth International Congress on Electron Microscopy

詳細情報

• CRID: 1573668924448416128
• NII論文ID: 10008810089
• データソース種別:
  • CiNii Articles