Secondary Electron Detection Efficiency for Magnetic Lenses with a Retarding Electrostatic Field

• Mamoru Nakasuji

• Hiroyasu Shimizu

Bibliographic Information

Other Title

• Secondary Electron Detection Efficiency

Journal

• Journal of electron microscopy

  Journal of electron microscopy 45 (5), 359-363, 1996-10

  Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Details

• CRID: 1520573330790532480
• NII Article ID: 10008810803
• NII Book ID: AA00697060
• ISSN: 00220744
• NDL BIB ID: 4071322
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4071322
• Text Lang: en
• NDL Source Classification:
  • ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
• Data Source:
  • NDL
  • CiNii Articles