TEM Observation of Microstructures in RF-Sputtered Sm-Fe Magnetic Thin Films

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著者

    • Sun Hong SUN Hong
    • Fundamental Research Department, Corporate Research and Development Laboratories
    • Itoh Yutaka ITOH Yutaka
    • Electronics Materials Science Department, Advanced Technology Research Laboratories, Sumitomo Metal Industries, Ltd.
    • KAMEI Kazuhito
    • Electronics Materials Science Department, Advanced Technology Research Laboratories, Sumitomo Metal Industries, Ltd.
    • TOMIDA Toshiro
    • Fundamental Research Department, Corporate Research and Development Laboratories

収録刊行物

  • Journal of electron microscopy

    Journal of electron microscopy 45(5), 458-460, 1996-10-01

    Published for the Japanese Society of Electron Microscopy by Oxford University Press

参考文献:  4件中 1-4件 を表示

各種コード

  • NII論文ID(NAID)
    10008811085
  • NII書誌ID(NCID)
    AA00697060
  • 本文言語コード
    ENG
  • 資料種別
    NOT
  • ISSN
    00220744
  • NDL 記事登録ID
    4071336
  • NDL 雑誌分類
    ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
  • NDL 請求記号
    Z53-T76
  • データ提供元
    CJP書誌  NDL 
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