The correction of thin foil microanalysis data for X-ray absorption effects
収録刊行物
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- Electron Microscopy and Analysis 1979
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Electron Microscopy and Analysis 1979 413-416, 1980
The Institute of Physics
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詳細情報
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- CRID
- 1571135649658309376
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- NII論文ID
- 10008812573
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- データソース種別
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- CiNii Articles