Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope

• HAIDER M.

収録刊行物

• J. Electron Microsc.

  J. Electron Microsc. 47 395-405, 1998

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• CRID: 1570572699704666240
• NII論文ID: 10008813307
• データソース種別:
  • CiNii Articles